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Exam Details

Electrical Engineering 2006

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Questions 85
Duration 180 mins
Package ESE & GATE EE - Previous Year Papers

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Difficulty distribution

Medium 62 72.9%
Hard 20 23.5%
Easy 3 3.5%

Question type distribution

Multiple Choices 85 100%

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Sample questions from this paper

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1
2006 · Unclassified
Electrical Engineering 2006
Which among the following is true statement ?
A
A finite signal is always bounded
B
A bounded signal always possesses finite energy
C
A bounded signal is always zero outside the interval
D
A bounded signal is always finite
2
2006 · Unclassified
Electrical Engineering 2006
x (t) is a real valued function of a real variable with period T. Its trigonometric Fourier Series expansion contains no terms of frequency ω = 2rc (2k)/T; k = 1, 2, ... Also, no sine terms are present. Then x (t) satisfies the equation
A
B
C
D
3
2006 · Unclassified
Electrical Engineering 2006
In the figure the current source is 1 ∠0 A, R = 1 Ω, the impedances are ZC = – jΩ and Z1 = 2jΩ. The Thevenin equivalent looking into the circuit across X-Y is
A
B
C
D
√2∠45o & √2∠45o
4
2006 · Unclassified
Electrical Engineering 2006
The three limbed non ideal core shown in the figure has three windings with nominal inductances L each when measured individually with a single phase AC source. The inductance of the windings as connected will be
A
very low
B
3L
C
very high
D
L/3
5
2006 · Unclassified
Electrical Engineering 2006
Which of the following statements holds for the divergence of electric and magnetic flux densities?
A
Both are zero
B
These zero for static densities but non zero for time varying densities
C
It is zero for the electric flux density
D
It is zero for the magnetic flux density
6
2006 · Unclassified
Electrical Engineering 2006
In transformer, which of the following statements is valid?
A
In an open circuit test, copper losses are onbtained while in short circuit test, core losses are obtained
B
In an open circuit test, current is drawn at high power factor
C
In a short circuit test, current is drawn at zero power factor
D
In an open circuit test, current is drawn at low power factor