Diffraction, Spectroscopy and Microscopy - Characterization and Measurements of Properties - Engineering Sciences Previous Year Questions

1

2007 · Engineering Sciences · Characterization and Measurements of Properties · Diffraction, Spectroscopy and Microscopy

Engineering Sciences (XE) 2007

Match the experimental techniques in Group I with the applications in Group II and choose the correct matching from (A), (B), (C) and (D).

Group I (Technique)	Group II (Application)
P  X-ray diffraction	1. Resistivity determination
Q  Transmitted polarized light microscopy	2. Measurement of crystallite size
R  Four probe technique	3. Observation of inclusion
S  Zone refining	4. Observation of spherulites
	5. Purification of materials

A

P-2, Q-3, R-1, S-5

B

P-4, Q-3, R-5, S-3

C

P-4, Q-3, R-1, S-2

D

P-2, Q-4, R-1, S-5

Open complete paper

2

2008 · Engineering Sciences · Characterization and Measurements of Properties · Diffraction, Spectroscopy and Microscopy

Engineering Sciences (XE) 2008

If the full width at half maximum (FWHM) of the above peak is 0.4°, ignoring the instrumental broadening, the crystallite size of the material is

A

20.2 nm

B

20.5 nm

C

20.9 nm

D

23.7 nm

Open complete paper

3

2008 · Engineering Sciences · Characterization and Measurements of Properties · Diffraction, Spectroscopy and Microscopy

Engineering Sciences (XE) 2008

Match the characterization techniques listed in Group I with the applications listed in Group II and select the correct answer from (A), (B), (C) or (D)

Group I (Technique)
P. X-ray Diffraction
Q. Differential Thermal Analysis
R. Infrared Spectroscopy
S. Microscopy

Group II (Application)
1. Functional Groups
2. Crystallinity
3. Morphology
4. Enthalpy
5. Power Factor

A

P-5, Q-4, R-3, S-2

B

P-2, Q-3, R-1, S-5

C

P-3, Q-2, R-4, S-5

D

P-2, Q-4, R-1, S-3

Open complete paper

4

2009 · Engineering Sciences · Characterization and Measurements of Properties · Diffraction, Spectroscopy and Microscopy

Engineering Sciences (XE) 2009

Line broadening in X-ray diffraction pattern occurs on account of

A

Coarse crystallite size

B

Residual stresses

C

Multiplicity of phases

D

Coring of crystallites

Open complete paper

5

2009 · Engineering Sciences · Characterization and Measurements of Properties · Diffraction, Spectroscopy and Microscopy

Engineering Sciences (XE) 2009

Match the characterization technique with the most appropriate property
Characterization technique
P. infrared spectroscopy
Q. thermo-gravimetric analysis
R. transmission electron microscopy
S. differential scanning calorimetry
Property
1. melting point
2. functional group
3. degradation temperature
4. morphology

A

P-3, Q-2, R-4, S-1

B

P-3, Q-4, R-2, S-1

C

P-2, Q-1, R-4, S-3

D

P-2, Q-3, R-4, S-1

Open complete paper

6

2011 · Engineering Sciences · Characterization and Measurements of Properties · Diffraction, Spectroscopy and Microscopy

Engineering Sciences (XE) 2011

Match the techniques in Column-I with the descriptions in Column-II.

Column-I	Column-II
P. Differential scanning calorimetry	1. Residual stress measurement
Q. Atomic force microscopy	2. Surface morphology of a material
R. Scanning electron microscopy	3. Incident beam passes through a thin sample
S. X-ray diffraction	4. Thermal expansion measurement
	5. Resolution less than 1 nm is possible
	6. Measurement of enthalpy change

A

P-6, Q-5, R-2, S-1

B

P-4, Q-5, R-2, S-1

C

P-4, Q-1, R-3, S-2

D

P-6, Q-1, R-5, S-3

Open complete paper

7

2011 · Engineering Sciences · Characterization and Measurements of Properties · Diffraction, Spectroscopy and Microscopy

Engineering Sciences (XE) 2011

The full width at half maximum (FWHM) of the first peak is 0.35°. Ignoring micro-strain and instrumental broadening, the crystallite size of the sample (in nm) is

A

20

B

24

C

200

D

240

Open complete paper

8

2012 · Engineering Sciences · Characterization and Measurements of Properties · Diffraction, Spectroscopy and Microscopy

Engineering Sciences (XE) 2012

Which of the following signals is produced due to the elastic scattering of electrons by a material?

A

Secondary electron

B

Backscattered electron

C

Auger electron

D

Photoelectron

Open complete paper

9

2012 · Engineering Sciences · Characterization and Measurements of Properties · Diffraction, Spectroscopy and Microscopy

Engineering Sciences (XE) 2012

Microstrain can be measured by X-ray diffraction using peak

A

Area and intensity

B

Position and area

C

Broadening and intensity

D

Position and broadening

Open complete paper

10

2012 · Engineering Sciences · Characterization and Measurements of Properties · Diffraction, Spectroscopy and Microscopy

Engineering Sciences (XE) 2012

Find the first diffraction peak position (2θ) for Cu Kα radiation with a wavelength of 1.54 Å

A

21.76°

B

33.05°

C

44.43°

D

66.10°

Open complete paper

11

2013 · Engineering Sciences · Characterization and Measurements of Properties · Diffraction, Spectroscopy and Microscopy

Engineering Sciences (XE) 2013

Match the microscopes listed in Column I with their principle of operation listed in Column II

A

P-2, Q-5, R-3, S-1

B

P-3, Q-4, R-5, S-2

C

P-4, Q-3, R-2, S-1

D

P-4, Q-3, R-5, S-2

Open complete paper

12

2013 · Engineering Sciences · Characterization and Measurements of Properties · Diffraction, Spectroscopy and Microscopy

Engineering Sciences (XE) 2013

X-rays of unknown wavelength are diffracted by an FCC metal with a lattice parameter of 0.352 nm. The measured ‘2θ’ angle for the (200) peak is 61.08°. Calculate the wavelength of the X-ray used, in nm.

Check answer

Open complete paper

13

2014 · Engineering Sciences · Characterization and Measurements of Properties · Diffraction, Spectroscopy and Microscopy

Engineering Sciences (XE) 2014

Quantitative measurement of the roughness of a polysilicon wafer can be performed with

A

scanning tunneling microscopy

B

scanning electron microscopy

C

transmission electron microscopy

D

atomic force microscopy

Open complete paper

14

2016 · Engineering Sciences · Characterization and Measurements of Properties · Diffraction, Spectroscopy and Microscopy

Engineering Sciences (XE) 2016

Energy Dispersive Spectroscopy (EDS) in a typical scanning electron microscope enables elemental identification by collecting and examining which of the following:

A

Secondary electrons from the sample

B

Back scattered electrons from the sample

C

Characteristic X-rays from the sample

D

Diffraction pattern from the sample

Open complete paper

15

2016 · Engineering Sciences · Characterization and Measurements of Properties · Diffraction, Spectroscopy and Microscopy

Engineering Sciences (XE) 2016

In a diffraction experiment, monochromatic X-rays of wavelength 1.54 Å are used to examine a material with a BCC structure. If the lattice parameter is 4.1 Å, the angular position θ of the first diffraction peak is __________ degrees.

Check answer

Open complete paper

16

2016 · Engineering Sciences · Characterization and Measurements of Properties · Diffraction, Spectroscopy and Microscopy

Engineering Sciences (XE) 2016

A batch of spherical titania nanoparticles, uniform in size, has a specific surface area of 125 m\(^2\) g\(^{-1}\). If the density of titania is 4.23 g cm\(^{-3}\), the diameter of the particles is __________ nm.

Check answer

Open complete paper

17

2017 · Engineering Sciences · Characterization and Measurements of Properties · Diffraction, Spectroscopy and Microscopy

Engineering Sciences (XE) 2017

The contrast obtained in scanning electron microscope using back scattered electrons depends on

A

Atomic number of the specimen material

B

Accelerating voltage of the microscope

C

Working distance in the microscope

D

Type of the electron emitter in the microscope

Open complete paper

18

2019 · Engineering Sciences · Characterization and Measurements of Properties · Diffraction, Spectroscopy and Microscopy

Engineering Sciences (XE) 2019

On decreasing the objective aperture size in an optical microscope

A

the spherical aberration increases

B

the depth of field increases

C

the diffraction-limited resolution increases

D

the astigmatism increases

Open complete paper

19

2020 · Engineering Sciences · Characterization and Measurements of Properties · Diffraction, Spectroscopy and Microscopy

Engineering Sciences (XE) 2020

A Pb-Sn sample of eutectic composition, containing α- and β- phases, is examined in a scanning electron microscope. The α-phase contains ~97 wt% Pb (atomic number 82) while β-phase contains ~99 wt% Sn (atomic number 50). The ratio of number of backscattered electrons escaping from α-phase to that from β-phase would be:

A

Less than 1

B

Equal to 1

C

Greater than 1

D

Equal to 0

Open complete paper

20

2020 · Engineering Sciences · Characterization and Measurements of Properties · Diffraction, Spectroscopy and Microscopy

Engineering Sciences (XE) 2020

Smallest or minimum feature size that can be theoretically resolved in an optical microscope does NOT depend on:

A

Refractive index of the medium between the lens and the focal point

B

Intensity of radiation

C

Wavelength of radiation

D

Numerical aperture of the objective lens

Open complete paper